Jimmie A. Miller, PhD
Chief Engineer, Center for Precision Metrology, Graduate Faculty
The University of North Carolina at Charlotte


PhD Engineering (Precision Engineering), University of Warwick, Coventry, England, July 1994.
MSE Engineering (Microelectronics) University of North Carolina at Charlotte, Dec 1987.
BS Physics, University of North Carolina at Charlotte, May 1985.
BS Mathematics,  University of North Carolina at Charlotte, May 1985.
AAS Electronics Engineering TechnologyRowan-Cabarrus Community College, Sep 1980.  

PhD THESIS: "From STM to Nanomemory: A Transfer of Technology Feasibility Study". University of Warwick, Coventry, England, Engineering Dept., 1994. (Most of this research was completed at UNC Charlotte)
Available via NinerCommons : https://ninercommons.uncc.edu/islandora/object/work%3A64

MASTERS THESIS: "Negative bias temperature instability in wet and dry oxides". University of North Carolina Charlotte, Mechanical Engineering and Engineering Science Dept., 1987.


¤         Metrology Systems

¤         Metrology of Machine Tools

¤         Dimensional (3D , Length) Metrology (Nanoscale to Large Scale)

¤         Optical Metrology

¤         Mathematical Modeling of Systems (Metrology, Sensors, Geometric, Calibration etc)


American Society for Precision Engineering (ASPE)  Member since 1991
            Board Member 2016-18
            Director at Large, Chair (2016-18) of the Metrology Systems Committee
            Tutorial presenter at annual meetings (various dates)

American Society of Mechanical Engineers B5 TC52 Standards Committee
B5.64 Methods for the Performance Evaluation of Single Axis Linear Positioning Systems (Drafting)

      Metrology in Basics of Precision Engineering
, Leach and Smith Eds. 2018    ISBN 9781498760850


Chief Engineer: Center for Precision Metrology @ UNC Charlotte Mar 1993-Present -  graduate student research consultation and design review, industrial project development, limited supervision of electronics and mechanical technicians, equipment training and repair, equipment budgeting and procurement specification, and general managerial oversight of various precision engineering focus laboratories such as metrology and computer integrated manufacturing. Laboratory renovation and expansion coordinator.  

Teaching Activities:

¤         MEGR 7182, 8182 Machine Tool Metrology (Metrology Certificate Core)

¤         Senior design mentor/grader

¤         MEGR 3090 Topics: Metrology and Precision Engineering, Co-lecturer (3 periods)

Graduate Research Committee participation: thesis (21) / dissertation (14) identified later

STM Nanomemory Project, UNC Charlotte Aug 1989 - Dec 1992 Investigating the feasibility of producing a new type of memory with storage density 104 - 106 times greater than current technology. The project involved using scanning tunneling microscopy techniques to modify surfaces at the nanometer level. Other STM research included examining the wear pattern on cutting tools, process dependence of plasma enhanced chemical vapor deposition of germanium on silicon and diamond on silicon.  

Research Organizational Assistant, UNC Charlotte Jan 1989 - Aug 1989 Assisted Dr. Robert Hocken (Endowed Distinguished Professor) in the logistics involved in establishing the UNC Charlotte Precision Engineering Laboratory. Duties included technical diagramming for funded research, and writing specifications and contacting suppliers of research equipment, and other support functions.  Microelectronics Research, UNC Charlotte Sep 1986 - May 1988 Clean room fabrication of metal-oxide-silicon capacitors; parametrical testing using capacitance vs. voltage, conductance, and charge-capacitance techniques; obtaining doping profiles, and interface trap and oxide charge densities; bias temperature aging and hot carrier injection into oxides; data acquisition and computer programming.  

Physics Laboratory Instructor, UNC Charlotte Aug 1983 - May 1985 Teaching and grading an undergraduate middle level physics mechanics laboratory

Electronics Tester and Troubleshooter, Western Electric Oct 1980 - Aug 1981 Structured testing of telephone trunk line system components with board level troubleshooting.  


Invention Disclosure (July 2020): "Reference Artifact for Straightness, Squareness, Parallelism, and Positioning RASSPP", UNCC#2021-001
Provisional Patent (July 2021) US# 63/209,165 Piggyback superstructures for precision machining and metrology

US# 6,782,596 "Fiducial calibration systems and methods for manufacturing, inspection, and assembly" Miller, Jimmie A., Aug 31, 2004

US# 7,073,239 "Fiducial calibration and method for assembling parts" Miller, Jimmie A., July , 11, 2006

US# 7,065,851 "Fiducial Calibration Method for measuring a workpiece" Miller, Jimmie A., June 27, 2006

US# 6,434,845 "Dual-axis static and dynamic force characterization device." Pereira; Paulo H. (Peoria, IL); Muralidhar; Ashok (Minneapolis, MN); Hocken; Robert J. (Concord, NC); Miller; Jimmie A. (Salisbury, NC); Smith; Stuart (Charlotte, NC). August 20, 2002.

 JOURNAL REVIEWS  (>200) for (>20) JOURNALS :

Web of Science statistics
1 of 4 (out of several hundred) acknowledged for "exceptional performance" in 2019 and 2020 by the journal Precision Engineering


Liuqing Yang, Youxing Chen, Jimmie Miller, William J. Weber, Hongbin Bei, Yanwen Zhang, Deformation mechanisms in single crystal Ni-based concentrated solid solution alloys by nanoindentation”, Materials Science and Engineering: A, 856, 2022, 143685 https://doi.org/10.1016/j.msea.2022.143685

Jimmie Miller "Symmetry centering of artifacts on limited-range rotary carriages or joints" Precision Engineering,  77, 2022, Pp 40-45,

Qichang Wang, Jimmie Miller, Axel Von Freyberg, Norbert Steffens, Andreas Fischer, Gert Goch, "Error mapping of rotary tables in 4-axis measuring devices using a ball plate artifact",CIRP Annals  67(1) 2018 pp 559-62, https://doi.org/10.1016/j.cirp.2018.04.005

Jimmie Miller, "Two-dimensional matrix-based non-complex axis-of-rotation error modeling", Precision Engineering, (44) April 2016, Pp 93-108,
http://dx.doi.org/10.1016/j.precisioneng.2015.10.007  (http://www.sciencedirect.com/science/article/pii/S0141635915002111)
Datasets for Figures at http:dx.doi.org/10.17632/3bjr99z62n.1 

Jimmie Miller, Soumajit Dutta, Edward Morse and José Yague-Fabra , "Effective stylus diameter determination using near zero-width reference" Precision Engineering 35(3) 2011, p 500-504.

P. Ramua, J.A. Yagüe, R.J. Hocken and J. Miller, "Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine " Precision Engineering 35((3) 2011, p 431-9. 

Joao Bosco de Aquino Silva , Robert J. Hocken, Jimmie A. Miller, Gregory W. Caskey and Prashanth Ramu, "Approach for uncertainty analysis and error evaluation of four-axis co-ordinate measuring machines (CMMs)" 
 The International Journal of Advanced Manufacturing Technology: Volume 41, Issue11 (2009), Page 1130

Dongmei Ren, K M Lawton and Jimmie A Miller, "A double-pass interferometer for measurement of dimensional changes",  Measurement Science and Technology, 19/2 (2008) 531-534. (MST featured article)

Bethany A. Woody, K. Scott Smith, Robert J. Hocken, and Jimmie A. Miller, "A Technique for Enhancing Machine Tool Accuracy by Transferring the Metrology Reference From the Machine Tool to the Workpiece"  Journal of Manufacturing Science and Engineering -- June 2007 -- Volume 129, Issue 3, pp. 636-643 (2009 ASME Blackall Machine Tool and Gage Award)

Dongmei Ren, Kevin M. Lawton and Jimmie A. Miller, "Application of cat's-eye retroreflector in micro-displacement measurements" Precision Engineering, Vol 31, Issue 1, January 2007, Pages 68-71.

S. Smith , B.A. Woody, J.A. Miller, "Improving the Accuracy of Large Scale Monolithic Parts Using Fiducials" Annals of the CIRP Vol. 54/1/2005, pp483-7.

Lei Dong, John A. Patten, Jimmie A. Miller, "In-situ infrared detection and heating of metallic phase of silicon during scratching test" , Int. J. Manufacturing Technology and Management, Vol. 7, Nos. 5/6,  pp530-539 (2005)

Miller, Jimmie. A., Hocken, Robert, Smith, Stuart T., and Harb, Salaam, "X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positioner", Precision Engineering, 18(2/3), pp. 95-102 (1996).

Varhue, W. J., Carulli, J. M., Peterson, G. G., and Miller, J. A., "Low temperature epitaxial growth of Ge using electron-cyclotron-resonance plasma-assisted chemical vapor deposition", J. Appl. Phys. 71(4), 1949, (1992).

Varhue, J., Carulli, J. M., Miller, J. A., and Peterson, G. G., "Surface morphology of epitaxial Ge on Si grown by plasma enhanced chemical vapor deposition", J. Vac. Sci. Tech. B 9(4) 2202 (1991).

Miller, Jimmie A. and Hocken, Robert J. "Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite: initial results", J. Appl. Phys. 68(2), 905 (1990).

Miller, Jimmie A., Blat, Catherine, and Nicollian, Edward H.,"Accurate measurement of trivalent silicon interface trap density using small signal steady state methods", J. Appl. Phys. 66(2), 716 (1989).


Kuldeep Mandloi, Chris Evans, Jason Fox, Harish Cherukuri, Jimmie Miller, Angela Allen, Jeff Raquet, Brian Dutterer, Heat transfer characteristics of additively manufactured surfaces: an experimental and computational study, ASPE summer topical, Advancing Precision in Additive Manufacturing, July 2022.

Kuldeep Mandloi,, Chris Evans, Jason C. Fox, Harish Cherukuri, Jimmie Miller, Angela Allen, David C. Deisenroth, Alkan Donmez, Toward specification of complex additive manufactured metal surfaces for optimum heat transfer, Joint special interest group, Precision in Additive Manufacturing EUSPEN ASPE, Switzerland 2021

Vogl, G. W. (NIST)); Fesperman, R.R.(Corning); Ludwick, S. J. (Aerotech); Klopp, R.W. (Exponent); Grabowski, A. (Physik Instrumente); Lebel, J. (Renishaw); Miller, J.A. (UNC Charlotte); Brown, N. L. (ALIO); Belski, E.; Duncan, N. (Aerotech); Hennessey, C.W. (ALIO)", Development of a New Standard for the Performance Evaluation of Single Axis Linear Positioning Systems", Proceedings of the ASPE Annual Meeting, (2020) pp128-133  https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930937 

Laura Hopper, Todd Noste, Jimmie Miller, Chris Evans, "Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics," Proc. SPIE 11487, Optical Manufacturing and Testing XIII, 1148709 (20 August 2020); https://doi.org/10.1117/12.2568797

Todd Noste, Chris J. Evans, Jimmie A. Miller, and Laura E. Hopper "Concurrent engineering of a next-generation freeform telescope: metrology and test", Proc. SPIE 10998, Advanced Optics for Imaging Applications: UV through LWIR IV, 109980Y (14 May 2019); doi: 10.1117/12.2519162;  

T. Noste, L. Hopper, J. Miller, C. Evans, “Task specific uncertainty in measurement of freeform optics”  Proc. Euspen, Bilbao, Spain (2019). https://www.euspen.eu/knowledge-base/ICE19215.pdf

Wang, Q.,  Miller, J.,  Groover, J.,  Goch, G.. "Experimental verification of an error mapping technique for rotary tables/axes" , Proceedings - 33rd ASPE Annual Meeting 2018, Pages 21-25

Miller, Jimmie, "Scope of Metrology Systems", Proceedings of the American Society for Precision Engineering Annual Meeting, Portland OR,  Oct 23-28, 2016, 65, pp140-5 (2) (PDF) Scope of Metrology Systems (researchgate.net)

Du J, Kang W, Bridges P, Miller JA,  "Experimental Verification of Alignment Related Errors in Position Metrology of Axes of Rotation", Proc ASPE 2015, 62, 474-9. https://www.xcdsystem.com/aspe/files/2015%20ASPE%20Annual%20Meeting%20Proceedings.pdf

Miller, J. A.; Caskey, G. W.; Hocken, R. J.  "Optical alignment of SAMM to reduce cosine error" Proceedings of the ASPE 2011, 52, 238-41. https://www.xcdsystem.com/aspe/files/ASPE_2011%20AM.pdf

Ni, K.; Miller, J. A.; Hocken, R. J. ,"Metrology of a Precision Plasmonic Lithography Stage", Proceedings of the ASPE 2011, 52,  532-34. https://www.xcdsystem.com/aspe/files/ASPE_2011%20AM.pdf

Miller JA, Saad ME-S, Caskey GW, Aguilar-Martin,  "Interferometric measurement of the low value  CTE of a ball bar", Proceedings of the ASPE 2010 Annual Meeting. https://www.xcdsystem.com/aspe/files/ASPE_2010%20AM.pdf

Ren, D. M., Lawton, K. M., Miller, J. A., Zhu, Z. Y., & Wan, Y. (2009). The design of the optical system in the balanced interferometers. Jiliang Xuebao/Acta Metrologica Sinica, 30(SUPPL. 1), 1-4. 10.3969/j.issn.1000-1158.2009.z1.01

D. Ren, J. A. Miller and K. M. Lawton, "Uncertainty in measurements of dimensional changes from an interferometric dilatometer", Proceedings of the ASPE 2007 Annual Meeting, Dallas, TX, pp. 340-343. https://www.xcdsystem.com/aspe/files/ASPE_2007.AM.pdf

Ren D., Lawton K.M. and Miller J.A., "Application of cat's-eye retroreflector in micro-displacement measurement", Proceedings of the ASPE 2005 Annual Meeting, vol (37), Oct. 9-14, 2005, Norfolk, VA, pp. 379-382.

Lei Dong, John A. Patten, and Jimmie A. Miller, "In-Situ Infrared (IR) Detection and Heating of the High Pressure Phase of Silicon During Scratching Test" in Surface Engineering 2004-Fundamentals and Applications, edited by Soumendra N. Basu, James E. Krzanowski, Joerg Patscheider, and Yury Gogotsi (Mater. Res. Soc. Symp. Proc. 843, Warrendale, PA , 2005), T6.5/R10.5

Woody, BA; Smith, KS; Hocken, RJ; Miller, JA "Uncertainty analysis for the Fiducial Calibration System" ASME International Mechanical Engineering Congress and Exposition, NOV 05-11, 2005 Manufacturing Engineering and Materials Handling, 2005 Pts A and B 16: 699-706 Part 1-2 2005 

Miller, Jimmie A, Morse, Edward P, Nettles, John A, Turner, Jeremy S, " Kite Square", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 450-454. https://www.xcdsystem.com/aspe/files/ASPE_2004.AM.pdf

Dong, Lei; Miller, Jimmie A; Patten, John A,; "In-situ infrared (IR) detection of the high pressure phase transformation of silicon during scratching test", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 137-140. https://www.xcdsystem.com/aspe/files/ASPE_2004.AM.pdf

Patten, John A,; Dong, Lei; Miller, Jimmie A; "Electrical and optical detection and heating of the high pressure metallic phase of silicon during scratching with diamond and its effect on the material's hardness", Proceedings of the ASPE 2003 Annual Meeting, Oct 26-31, 2003, vol 30 (2003) pp 507-510. https://www.xcdsystem.com/aspe/files/ASPE_2003.AM.pdf

Feng , Qibo; Hocken, Robert J.; Miller, Jimmie A.; "Quick and dynamic measurements of geometric errors of CNC machines", in Process Control and Inspection for Industry Proceedings of SPIE vol 4222 (2000) pp 110-113.

Miller, Jimmie A.; Hocken, Robert; Feng, Qibo; and Ramanan, Vignesh; "Foundation for Dynamic Metrology of Machine Tools" Proceedings of the ASPE 1999 Annual Meeting, Oct 31- Nov 4, 1999, in Monterey California. https://www.xcdsystem.com/aspe/files/ASPE_1999.AM.pdf

Salsbury James; Hocken, Robert; Miller, Jimmie; and Raja, Jay; "Graduate Level Education in Metrology", Proceedings of the 1999 NCSL Workshop and Symposium, July 1999, pp 351-362.

Hocken, R., and Miller, J. A., "Nanotechnology in metrology", Proceedings of the Fifth International Symposium on Robotics and Manufacturing, August 14-18, 1994 in Maui, Hawaii.

Hocken, R. et al., "Research in engineering metrology…" Proceedings of NSF Design and Manufacturing Conferences, 1993 and 1994.

Miller, J. A., Smith., S.T., "Tunneling current characterization: An application of an X-ray interferometric calibrated stage," Proceedings of the ASPE 1993Annual Meeting, Nov 1993, pp. 37-40. https://www.xcdsystem.com/aspe/files/ASPE_1993%20AM.pdf

Hocken, Robert J., and Miller,. Jimmie A., " Nanotechnology and its impact on manufacturing", Japan/USA Symposium on Flexible Automation ASME 1992, p 7ff.

Lavigne, C., Miller, J. A., and Hocken., R. J. , "A long range STM/AFM" Proceedings of the ASPE 1991 Annual Conference, Santa Fe, NM, Oct 1991.

Miller, J. A., Hocken, R., "Scanning tunneling microscopy bit-making for use in high density memory chip applications," Proceedings of the ASPE 1990 Annual Conference, Nov 1990, pp. 119-120. https://www.xcdsystem.com/aspe/files/ASPE_1990.pdf

SOCIETY MEMBERSHIP Member of the American Society for Precision Engineering (ASPE).



 participation for thesis/dissertation:

    PhD: Kuldeep Mandloi (In-progress) Investigation of thermal and fluid flow characteristics of AM surfaces with different build angles through CFD and experiments
    PhD: Prithiviraj Shanmugam (In progress) Variable shearing holography
    PhD, Abolfazl (Milad) Hosseinpour, Dec 2022, Improved fidelity of triangulation sensor measurements in optical inspection
    PhD: Jacob Cole Mar 2022 Characterization of surfaces by X-ray reflectometry
    PhD: Chunjie Fan Aug 2021 Controlling force and displacement: Instrumentation design and application in thermal actuation and nanoindentation
    PhD Kumar Arumugam, May 2021, Implementation and evaluation of optical and stylus based profiling Techniques for surface metrology
    PhD: Dustin Gurganus July 2021, Manufacturing methodologies and optomechanics for dynamic freeform optics

    PhD: Kumar Arumugam, April 2021, Implementation and evaluation of optical and stylus-based profiling techniques for surface metrology
    PhD, Todd Noste, Dec 2020, Freeform optical surface form metrology with serial data acquisition
    PhD, Prashanth Jaganmohan, Dec 2020, Data processing, modeling, and error analysis in discrete part geometric inspection
    PhD: Masoud Arablu May 2019, Polydyne displacement interferometer using frequency-modulated light
    PhD: Qichang Wang April 2019, Performance investigation of rotary tables in large scale metrology
    PhD: Farid Javidpour April 2019, Quantification of profile measurement data
    PhD: Michael Uwakwe, Feb 2018, Minimizing task-specific uncertainty in CMM based freeform optics metrology
    PhD: Saeed Heysiattalab July 2017, Data models to support metrology
    PhD: Lucas Valdez Dec 2015,  Improved measurement methods for in-process metrology on large scale components
    PhD: Mario Valdez Dec 2015, Task specific uncertainty for industrial measurements
    PhD: Neil Gardner, April 2007, Precision Geometric Metrology of Refractive Micro-lenses
    PhD: Dongmei Ren, Oct 2006, Optical Measurements of Dimensional Instability
    PhD: Lei Dong, Oct 2006, In-situ detection and heating of the high pressure phase of silicon during scratching

    Masters: Ryan Gorman  Dec 2022 Detection and classification of defects in metal parts using ATOS 2019
    Masters: Steven Swagler April 2022 Ultraprecision diamond machining of polycarbonate complex multi-sided freeform optics
    Masters: Cecil (DJ) Hastings, July 2021, Development of an all-fiber homodyne laser interferometer for integration into a compact thermal actuator
    Masters: Alyson Light, November, 2020, Optical instrumentation using geometric phase elements
    Masters: Robert Turnbull, April 2020,  An investigation of structured light scanner calibration
    Masters: Attilio (AJ) Minnuti, March 2020, Industry implications of ASME Y14.5-2018 rules(s) and the "nested" principle
    Masters: Abhinav Mishra, Sept 2019, A modified self-interference based incoherent digital holographic recording system

    Masters: Corbin Grohol Sep 2018, Toward fixtureless inspection of automotive fenders
    Masters: Jesse Groover, Nov 2018, Generation milling of cylindrical involute gears
    Masters: Prashanth Jaganmohan, May 2017, Metrology Bench
    Masters: Harsh Patel, May 2016, A study of parameters influencing the vehicle wheel alignment measurements
    Masters: William Land II, June 2015, Characterization and in-process metrology of a laser powder fusion additive manufacturing machine
    Masters: Paul Anderson, Apr 2015, Sub-scale machining of large components
    Masters: Victoria Welty, Apr 2015, Dynamic evaluation of laser trackers
    Masters: Yue Peng, Mar 2015, Metrological evaluation of size specifications in ISO 144405-1
    Masters: Raunak Jadhav, Dec 2013, Error budget software for machine tools
    Masters: Kane Lingerfelt, Nov 2013, A study of modulated tool path machining and its effect on tool life in CNC turning operations.
    Masters: Wesley Love, Nov 2012, Evaluating CNC machine tool dynamic performance for modulated tool-path (MTP) chip breaking
    Masters: Parik  Kulkarni, Nov2012 Evaluation of datum reference frame sensitivity and its effect on freeform metrology
    Masters: Soumajit Dutta,  Aug 2008, Open Metrology Software
    Masters: Wichuda Chikosol, Dec 2007, Performance Testing of Cylindricity/Roundness Measuring Machine
    Masters: Prashanth Ramu, Dec 2007,  Error Evaluation and Uncertainty for a Five-Axis Multi-sensor, Coordinate Measuring Machine
    Masters: David Winkowski: 2005, A high precision temperature controlled vacuum chamber for use in a dilatometer with sub-nanometer resolution.